LTX Fusion CX

Problem:
- T07-LTX device continue fail.
- Philips OM5952 intermittent failure on test # 700, 704, 714 & 722.
- Procedure for changing/setting the OS on LTX Tester.
- LTX CX Tester information.
- OVI_VRF fail only on Slot 20.
- Philips OM5952 encountered hi T704 and T714 rejects.
- rf_cal show “cal factor too big, fail slot 100 and slot 101, digitizer error at slot 6”.
- Philips OM5952 continuos fail.
- Infineon Z3347 fail Bin 6, (T2950/T2952/T2954).
- Infineon Z3347 fail Bin 7 test #3110 & #3111.
- Update calibration files on T63-LTX running Z3347 & Z6272.

Date: 11/25/05
Problem: Update calibration files on T63-LTX running Z3347 & Z6272.
Information:
- Perform following if changing of program between Z3347 & Z6272.

1. cd /opt
2. tar -xvf ltx_nic_normal.tar (setup for Z3347)
   tar -xvf ltx_nic_6272.tar (setup for Z3347)
3. restart tester

1. cd /opt
2. tar -cvf ltx_nic_normal.tar ltx_nic (normal cal)
   tar -cvf ltx_nic_6272.tar ltx_nic (RF_cal with PPI)
if not perform pls don’t create backup files

Date: 11/25/05
Problem: Infineon Z3347 fail Bin 7 test #3110 & #3111.
Troubleshooting route:
- Change RF cal files to Z3347, same.
- Performed Full cal, all passed.
- Change PPI, device pass but upon reloading of Test Program device fail again.
- Noticed that measurement value on DSP calibration when device fail is out.
- for datalog.
- Change Digitizer and performed cal, same.
Solution:
- Change AWG and performed cal, device passed consistently.
Conclusion: Device fail Bin 7 test #3110 & #3111 are caused by AWG even though the checkers and cal is all passing.
Remarks: N/A.
Done by:
Ricardo Dela Pena (Tester Group, Test Product Engineer)
Salvador Supena Cuate, Buddy (LTX Platform Module Leader, Senior Line Engineer)

Date: 05/05/05
Problem: Infineon Z3347 fail Bin 6, (T2950/T2952/T2954).
Troubleshooting route & Solution:
- Verify set up at another tester, encounter gross failure on VANTH/VANTHM/VANTL.
- VANTH using socket pin C8 - Relay K5 & K7.
- VANTHM using socket pin C9 - Relay K5 & K7.
- VANTL using Relay K7.
- Found K5 and K7 relay faulty, change relay.
- Run loop test, pass 100%.
- Run at original tester, but still fail T2408 (VPCL) when perform loop test.
- T2408 (VPCL) test connected from pin J3A.
- J3A1 to A4 - ovi slot 18.
- J3A5 to A12 - ovi slot 17.
- J3A15 and A16 - awg slot.
- Run cx-connect/awg/ovi - ck/cal and vrf.
- Cx-connect fail due to ovi slot 20 channel 6, re-boot tester and re-run, passed.
- Ovi-ck fail slot 20 channel 6 and slot 18 marginal.
- Re-run ovi-ck, slot 18 pass and slot 20 still fail in same failure.
- Ovi- cal and ovi- vrf pass.
- Ovi slot 20 channel 6 was not connected to pin J3A group.
- Run loop test, pass 100%.
Conclusion: Loadboard relay causing device to fail.
Remarks: N/A.
Done by: Chew Thaddaeus, Kyle (D-Shift Acting Shift Leader, Test Manufacturing Senior Associate Engineer).

Date: 03/19/05
Problem: Philips OM5952 continuos fail.
Troubleshooting route & Solution:
Day 1
- Gold units calibration cannot passed, failing on DCS.
- Run checkers, found that DSQ board is having failing.
- Change DSQ board & performed CAL, passed. Tried device passed.
- Endorsed to production, after 5hrs of testing problem, running test yield drop, failing test #726 & #727.
- Change socket and loadboard, same failure.
Day 2
- Try golden unit, pass consistently (marginallly passed).
- Swapped SMIQ #11 & #12 and performed checkers and RF CAL, all passed.
- Tried device passed but the reading test #801 & #803 were marginally passed.
- Dock on handler device failed, intermittent failing on test #511 and all the TX test.
- Checked set-up, found that the connection between Right RF brick & Digitizer was loose.
- Swapped SMA cable to other SMA cable not in use and tried device passed, but not as stable.
- Failing on test #726 & #727 on some occasion.
- Change SMIQ add #12 and performed full CAL, failed on Digitizer check.
- Tried device passed, gold units passed consistently but production units failed.
Day 3
- Change Digitizer and performed checkers and CAL, passed.
- Tried device passed consistently both production units and gold units.
- Dock on handler(H19-NS64), device passed but having a high number of failure on test #802 which is an invalid test failure.
- Undocked do static test, consistently passed, redo setup on handler, same failure test #802.
- Change loadboard and socket, same failure.
- Checked handler planarity on Index ARM, found minor alignment problem on Index ARM, posibble caused of the problem.
- Rectified the handler alignment problem but test failure remain the same, failing test #802.
- Suspect handler problem, ask planner for available handler.
Day 4
- Convert handler H07-HT84, redo set-up using the newly converted handler.
- Device passed consistently for both production units and gold units.
- Run production units, first 1000 units, the running test yield 99.0%.
- Checked VM for ball quality checked were all OK.
Conclusion:
- Defective DSQ board causing DCS failure.
- Loose connection between Right BRICK and digitizer board causing test #726 & #727 failure.
- Handler planarity causing device fail intermittent.
Remarks:
Tips on how to isolate the problem, if a setup or a tester problem, when do setup verification both known good production units and known gold units were passing at static or dynamic test. otherwise have to trouble the problem.
Done by: Salvador Supena Cuate, Buddy (LTX Module Leader, Senior Line Engineer).

Date: 03/06/05
Problem: rf_cal show “cal factor too big, fail slot 100 and slot 101, digitizer error at slot 6”.
Troubleshooting route:
- Change socket and try other load board, fail golden unit cal.
- Tried loadboard at other tester, passed.
- Perform tester full CAL.
- Tester fail on rf_cal. Error message, “cal factor too big, fail slot 100 and slot 101, digitizer error at slot 6”.
Solution:
- Resit Slot #6 and the 2 cables.
- Re-cal rf_cal, passed.
- Try golden unit, golden cal passed.
- Loop 200 times, consistent passed.
- Dock up and release for production.
Conclusion: Loose Digitizer Board causing device failing.
Remarks: N/A.
Done by: Chow Chee Keong (A-Shift Associate Engineer, Test Manufacturing Associate Engineer).

Date: 03/03/05
Problem: Philips OM5952 encountered hi T704 and T714 rejects.
Troubleshooting route:
- Cleaned socket, problem exist.
- Undock tried handtest, passed intermitttent.
- Reboot tester, re-run gold cal,passed but failed intermittent again during loop test.
- Verified loadboard and socket at another tester, passed consistent. Confirmed loadboard and socket OK.
- Proceed to run ovi full cal, passed but same problem still exists.
- Swapped RF source cable and I/Q cable at SMIQ add#12 with 14, device able to pass consistent during loop test.
- Reutrned the cables back to the original location, failed intermittent again.
- Confirmed SMIQ problem.
Solution:
- Swapped SMIQ add#12 with 14 and proceed to do RF full cal, passed.
- Device able to pass consistent during looping.
- Dockup, re-do height cal and endorsed back to MFG.
Conclusion: SMIQ causing the hi rejects.
Remarks: N/A.
Done by: Tan Kiam Heong (A-Shift Shift Leader, Test Manufacturing Senior Associate Engineer).

Date: 12/01/04
Problem: OVI_VRF fail only on Slot 20.
Troubleshooting route:
- Swap OVI board, change Interconnect board, clean slot & swapped DUT interface board, same.
Solution:
- Found out that after changing another set of DVM meter (set 2), OVI_VRF passed.
- Upon verification it was concluded that the caused of the failure is not the DVM meter the culprit is the CAL cable.
- This cable is connected in front of the test head where the signal flow during cal and verify.
Conclusion: CAL cable causing the failure.
Remarks:
- Pls take note that this cal cable is tight/properly connected to the test head, any resistance caused by poor contact will affect the tester calibration and verify.
Done by: Salvador Supena Cuate, Buddy (LTX Platform, Senior Line Engineer).

Date: 11/24/04
Problem: LTX CX Tester information.
Information:
- Step Bus Adapter (slot 1)
- Octal Voltage Current (slot 2,3,4,17,18,19,20)
- Digitizer (slot 6)
- AWG (slot 16)
- Digital Pin Card (slot 10 & 12)
- Digital Sequencer Card (slot 11)
- RF16 (slot 100)
- RF16EB (slot 101)
- Infineon:
  S2006/Z3347
  - Odd Ports: 1,3,5
  - Even Ports: 4,6,8,14
  S2014
  - Odd Ports:1,3,5,7,9,15
  - Even Ports:2,4,6,8,10
  Z2256
  - Odd Ports:1,3,5,7
  - Even Ports:2,4,6,8
  Z8680
  - Odd Ports:1,3,5,7
  - Even Ports:2,4,6,8,14,16
- Philips:
  OM5178HN
  - Odd Ports: 1,3,9,11
  - Even Ports: 2,4,10,12
  OM5952AET
   Odd ports: 1,3,9,11
   Even ports: 2,4,10
Conclusion: N/A.
Remarks: N/A.
Done by:
Lee Cheng Jian, Edmund (Test/Product Engineer)
Zhong Yu (Test/Product Senior Associate Engineer)

Date: 09/01/04
Problem: Procedure for changing/setting the OS on LTX Tester.
Procedure:
- Open command tool window.
- Go to path directory. ( cd /opt/ltx/releases )
- List contents of the directory ( ls -lrt )
  eg: R11.0.CX.A3, R11.0.CX.A11, R11.2.2 & etc.
- Type ( set_os R11.0.CX.A3.2 ). The OS revision will change to R11.0.CX.A3.2.
- Load the Program and will ask you to RESTART_TESTER. Click this button to update the Revision.
Conclusion: N/A.
Remarks: N/A.
Done by: Robinson Fajardo Pascual (Maintenance Engineer).  

Date: 10/23/04
Problem: Philips OM5952 intermittent failure on test # 700, 704, 714 & 722.
Troubleshooting route:
- Initially device will passed consistently during gold cal as well manual testing.
- Upon running on handler mode few units will passed but after awhile will failed continously even we do manual testing.
- Found that the above test failure is using SMIQ add # 11 & 12 when testing the device.
- Swapped SMIQ Add # 11 &12 and performed RF_cal & RF_vrfy, both passed. Device also passed consistently.
- Docked up without doing handler teaching ( Mustang handler ).
- Device passed but low yield ( 50 % ), mostly failing marginal on test # 800, 801 & 803, 551.
  when running on handler mode but still passed on manual testing.
- Redo gold cal and performed handler teaching. Running yield increased to 84 % but most test failure was test # 551.
- Adjust contact value from 145.050mm to 145.450mm to solve test # 551 failure . Current running running yield approximately 93 %.
Solution:
- Redo golden unit calibration & contact height.
Conclusion: Golden unit calibration is out & insufficient contact height causing low yield.
Remarks: N/A.
Done by: Salvador Supena Cuate (LTX Platform, Senior Line Engineer).  

Date: 08/26/04
Problem: T07-LTX device continue fail.
Troubleshooting route:
DAY 1:
- Change socket, loadboard, PPI & Bin 1 device, still failing "Power Supplies".
- Unload and reload program and perform step (i), still the same.
- Reboot whole tester and perform step (i), still the same.
- Check SMIQ relay counter, SMIQ#14 exceed 6 million, change SMIQ#14.
- Perform RF_CAL & RF_VRF, passed. But device still fail.
- Perform full tester calibration, passed. But device still fail.
DAY 2:
- Check hardware configuration, observe that SMIQ#12 is not in list.
- Observe that handler interface is connected to tester, remove interface cable, SMIQ#12 detected.
- Reload program, program loaded & initial self-calibration passed.
- Try device, device passed consistently. Verify with other 3 loadboard, device passed consistenly.
- Verify with other socket, device passed consistently.
- Dock-up & run 1 tube of Bin 1 using handler, device failed.
- Observe that initial self-calibration not complete, SMIQ#12 lost again.
Solution:
- Suspect UHIB/GPIB interface box faulty, change a known good interface box, reload program.
- Program loaded & initial self-calibration passed, device passed.
- Run 1 tube of Bin 1 using handler, communication OK, device passed consistent with 98% yield.
- Run production and monitor 10 mins, OK. Fully release to production.
Conclusion: Faulty UHIB/GPIB causing interruption during tester trying to run self-calibration which using SMIQ#12.
Remarks: N/A.
Done by: Lim Chang Fei (PM Group).