Credence

Problem:
- T05-DUO power trip.
- T04-QTET tripped during set-up for device Intel 2481.
- T03-DUO tester trip.
- T03-DUO Burn Power Supply 7.0V PM3/4.
- Intermittent fail Conti Bin 5 on Site 2 (T04-DUO).
- G5108 site2 failed GAIN TEST on pins #181 and #273.
- G5108 site1 failed conti intermittently.
- Credence Valstar hang.
- Proper power down and power up of Credence Valstar.

Date: 04/06/05
Problem: Proper power down and power up of Credence Valstar.
Procedure:
- Shutdown the CPU by:
  % su
  % password : valstar
  # shutdown -i0 -g0
  ok
- Turn off the test head power, switch located near the manipulator.
- Turn off the tester's main breaker, located behind the mainframe.
- Switch off the chiller's power.
- Before turning on the power, wait for about 5 minutes to avoid damage to the chiller's pump.
- Switch on the tester's main breaker.
- Switch on the chiller.
- Switch on the test head power.
- Power on the CPU and wait for the boot up to complete.
- Login as field and re-initialize the tester by the following:
  % cd ~field
  %> source .0
  %> vvv

Date: 04/06/05
Problem: Credence Valstar hang.
Troubleshooting route & Solution:
CONDITION 1: If any of the xterm windows are still useable
Login as root and do a proper shutdown and reboot as:
% su
% password : valstar
# shutdown -i0 -g0
ok sync

After boot up is complete:
% cd ~field
%> source .0
%> vvv

CONDITION 2: If none of the xterm windows are useable:
Do a hard reboot using the CPU power switch

After boot up:
% su
% password : valstar
# fsck
# shutdown -i0 -g0
ok sync

After boot up is completed:
%cd ~field
%> source .0
%> vvv

Note: You might need to repeat fsck process a few times till all errors are cleared.

CONDITION 3: For T01-STAR only:
- Before rebooting the tester, reconnect RS232 cable (Serial Port) behind the CPU.

Serial Port cable
- After completion of boot up process, disconnect this cable again otherwise tester wil hang after running for a few hours.

Date: 04/06/05
Problem: G5108 site1 failed conti intermittently.
Troubleshooting route & Solution:
- Checked site1 using engineering socket, intermittent fail on pins #75 and #85.
- Undocked loadboard and checked for pogo pins. 4 pins were found damaged.
- Replace the pins and run system VERIFY.
- Pin #75 was found to be failing on TEST 4-3 (Short to Ground(I/O & Pmu) relay check).
- Run system DIAGNOSE on pins (73-80) and pins (81-88).
- Pins #73 to #80 were failing on IO/PMU Relay Path.
- Further verify the pincard, pins (73-80) was swapped to pins (81-88).
- Run partial calibration on the swapped pincards.
- Pin #83 failed on Pull-up/Pull down current correction. This pin was the previously pin #75.
- Changed defective pincard with spare. Run partial calibration and system verify - passed.
- Device passed consistenly.
Conclusion: Defective pincard cause conti failure
Remarks: N/A.
Done by: Ferdie Catahay Aquino (Other Tester Platform, Line Engineer)

Date: 04/06/05
Problem: G5108 site2 failed GAIN TEST on pins #181 and #273.
Troubleshooting route & Solution:
- Verify setup with known good units using engineering socket but to no avail.
- Use spare loadboard and same error.
- Run system VERIFY and system MT_DIAGNOSE, passed.
- This tester was initially failing gain on site1. AWG1 boards for slot 57(site1) and slot 58(site2) were swapped.
- changed AWG1 board on slot 58.
- Perform partial calibration on pins #181, #273 and AWG1 at slot 58.
- Run system VERIFY and MT_DIAGNOSE again, passed.
- Setup device and loop test, both sites consistently passing.
Conclusion: AWG1 board was causing the GAIN failure.
Remarks: N/A.
Done by: Ferdie Catahay Aquino (Other Tester Platform, Line Engineer)

Date: 01/07/05
Problem : Intermittent fail Conti Bin 5 on Site 2 (T04-DUO).
Troubleshooting route:
- Perform manual test, still fail.
- Use Engineering socket do static looping, intermittent passing but more on Conti Bin 5 failure.
- Fail DUT Pin#215. check pogo pin, OK. However, still change pogo pin for verification.
- Unload program and retest, still fail intermittent.
- Change loadboard and test, still fail same failure.
- Reseat Pin Card B Slot#3, (P209-216).
- Test device, still fail.
Solution:
- Pin 215 was failing on verify, diagnostic and partial calibration.
- The said card was replaced and passed calibration afterwards.
- Another Pin Card, (P112-119) was also changed due to failure on Pin#115.
- Device passed on dual site.
Conclusion: Faulty Pin Card, (P206-216) causing intermittent Conti failure.
Remarks: N/A.
Done by:
Chua Gee Wee, Raymond (C-Shift Shift Leader, Test Manufacturing Senior Assocaite Engineer)
Ferdie C Aquino (Other Tester, Line Engineer)

Date: 12/25/04
Problem : T03-DUO Burn Power Supply 7.0V PM3/4.
Troubleshooting route:
By Ricky Belloco Lorio
- Use the power supply of PM7/8 which is 7.3V for the replacement of burn 7.0V.
- After installing of the the 7.3v and try to power on the system without the loadboard at the test head.
- The power always trip power on.
- Try to check cause of the problem.
- First noticed that the power supply 5.2V ASM was not turning on upon system power up.
- Check the input voltage and found out that there is no reading for any supply.
- Check the power condition and found out that the breaker for 5.2V ASM was not fully latched.
- Try to isolate the problem at the breaker side and confirm that the breaker itself was already faulty.
Solution:
By Ferdie C Aquino
- Check the Fault Display Indicator and some modules were lighted (red LED) namely:
  - PM8
  - +15 V
  - Power sequencer
  - ASM1 (power fault)
- Swapped back the power supply (7volts) that was transferred from PM7/PM8 to PM3/PM4 to original location, PM7/PM8.
- PM8 is needed during power up.
- Took one power supply (7 volts) from idle QTET tester and installed to location of PM3/PM4.
- Took one circuit breaker from the power conditioner of the idle QTET tester and replaced the defective circuit breaker of the T03-DUO power conditioner.
- Power up system, OK.
- Adjusted the two power supplies to correct voltage rating (sense line).
- Run verification on the system and two channels were failing 200 and 206.
- Verify device and passing consistently.
Conclusion: Tester tripped due to defective power supply.
Remarks:
- Tester was endorsed to production even though two pincards were failing.
- Device don't used the said pins.
- System will undergo further repair once planner released the system.
Done by:
Ferdie C Aquino (Other Tester, Line Engineer)
Ricky Belloco Lorio (Test Manufacturing Assocaite Engineer)

Date: 11/27/04
Problem 1: T03-DUO tester trip.
Troubleshooting route & Solution:
- System tripped due to DSM1 (power supply for 5.1V, 5.1V and 2.0V) defective.
- Installed newly arrived DSM1 power supply to the system.
- Calibrated power supply but to no avail.
- Ran diagnostics and found Analog I/O board failing on pin 1, and TH diagnostic failed for pins1-128.
- Ran calibration for some pins and PMU calibration failed.
- Found 2 cables at analog I/O board at common module were interswapped.
- Corrected the connection and checkers for pins 1-128 passed.
- Pincard for pin15 was changed due to failure on diagnostic.
- Performed full calibration. passed.
Conclusion: Faulty DSM1 causing tester to trip.
Remarks: N/A.
Done by: Ferdie C Aquino (Other Tester, Line Engineer).  

Date: 11/17/04
Problem: T04-QTET tripped during set-up for device Intel 2481.
Troubleshooting route:
- Check testhead, PIN Module 5 Pin card W slot 9 P313--320 red LED light up when tester trip.
Solution: Resit pin card. Monitor production, no more trip.
Conclusion: Loose Pin Card causing tester to trip.
Remarks: N/A.
Done by: Chua Gee Wee, Raymond (C-Shift Shift Leader, Test Manufacturing Senior Associate Engineer).  

Date: 11/10/04
Problem: T05-DUO power trip.
Troubleshooting route:
Problem1: System tripped on PG21 (161-168). The LED on I/O fault lighted.
Action : - verify the board by ranning diagnostic and calibration but passed.
- replaced the pincard anyway to isolate the system tripped.
- did diagnostic and calibration and pincard was passing.
Problem2: Pincard 177 was failing on verify test.
Action : - verify pincard by swapping to pin 185. Failure follows.
- replaced board and ran diagnostic and calibration. - passed
Problem3: PS2 latched when ps off * was key-in. This is used to off the DPS board when loadboard was removed from testhead.
Action : - swapped PS2 to PS7. no error.
- re verify by swapping to original slot and error comes out.
- placed PS2 module to PS7 slot and PS7 module to PS2 slot. no error.
Problem4: device was failing on two sites at RD_BHV_fail.
- site1 at pin83
- site2 at pin 169
Action: - change with engg loadboard and similar error.
- found that is contact issue since when engg socket is re-align the device will passed. (take note that socket will not flatly align to the receptacle due to socket fabrication).
- did the handler docking and aligned the testhead to handler properly. device is passing consistently.
Conclusion: N/A.
Remarks: So far yield is quite good. Will monitor for system trip.
Done by: Ferdie C Aquino (Other Tester, Line Engineer).